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A high-tech enterprise specializing in the research and development, production, sales, and service of intelligent equipment in the field of semiconductor chip packaging and testing.

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EH012 System Level IC Tester

Support Analog Analog chip Support Digital chip Support Display chip Support Power Power Chip Support SOC system chip Support uC Single chip

XD chip test series

Application Note:
Support Analog chip,
Digital chip,
Display chip,
Power chip,
SOC system chip,
uC single chip

Model description:
EH010: 50 channels of 10 trillion 1 million lines + analog
EH011: 100 channels of 10 trillion 500,000 lines + analog
EH012: 200 channels of 10 trillion 250,000 lines + analog

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Introduction
Specification

Analog measurement unit	3 total DA 0~12V, 2A 50 single DA/each pin 0~9V, 0.4A 50 single AD/each pin 50 double CP/each pin
Time base generating unit description	1 CLK output programmable 10K~10M shared by multiple DUTs
Description of Programmable Power Supply Unit	Adjustable voltage 2~8V /2mV current limit adjustable 1~400mA/1mA high resolution mV, mA
Description of Programmable Power Supply Unit	54 outputs, 1, 0, Z can be set 54 inputs, H, L, X can be compared to a total of 8MB memory depth 10MHz execution speed
Program burning unit description	It can be attached and can be written externally to write the test program. Write the customer's program to write the BOOT program
Open circuit current unit description	Probe contact measurement open and short circuit short circuit measurement leakage current measurement start current measurement
Precision measurement unit description	Force V quantity I 5 digits precision 3 gears voltage 2~8V /1mV current electricity 0~400mA /0.1uA
Description of Parameter Burning Unit	OSC frequency measurement and adjustment Vref voltage measurement and adjustment Ldet voltage measurement and adjustment